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[IEEE Proceedings of the 11th International Symposium on the Physical and Failure Analysis of Integrated Circuits. IPFA 2004 - Taiwan (5-8 July 2004)] Proceedings of the 11th International Symposium on the Physical and Failure Analysis of Integrated Circuits. IPFA 2004 (IEEE Cat. No.04TH8743) - Magnetic microscopy for ICs failure analysis : comparative case studies using SQUID, GMR and MTJ systems
Crepel, O., Poirier, P., Descamps, P.Year:
2004
Language:
english
DOI:
10.1109/IPFA.2004.1345534
File:
PDF, 271 KB
english, 2004