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[IEEE 2007 IEEE International Conference on Image Processing - San Antonio, TX, USA (2007.09.16-2007.10.19)] 2007 IEEE International Conference on Image Processing - Blind and Robust Watermarking of 3D Models: How to Withstand the Cropping Attack?
Alface, Patrice Rondao, Macq, Benoit, Cayre, FrancoisYear:
2007
Language:
english
DOI:
10.1109/ICIP.2007.4379866
File:
PDF, 182 KB
english, 2007