[IEEE 2012 21st Asian Test Symposium (ATS) - Niigata, Japan...

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[IEEE 2012 21st Asian Test Symposium (ATS) - Niigata, Japan (2012.11.19-2012.11.22)] 2012 IEEE 21st Asian Test Symposium - A New Look Ahead Technique for Customized Testing in Digital Microfluidic Biochips

Roy, Pranab, Rahaman, Hafizur, Dasgupta, Parthasarthi, Bhattacharya, Bhargab B.B.
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Year:
2012
Language:
english
DOI:
10.1109/ATS.2012.51
File:
PDF, 548 KB
english, 2012
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