Time-Based All-Digital Technique for Analog Built-in Self-Test
Vasudevamurthy, Rajath, Das, Pratap Kumar, Amrutur, BharadwajVolume:
22
Language:
english
Journal:
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
DOI:
10.1109/TVLSI.2013.2242909
Date:
February, 2014
File:
PDF, 2.23 MB
english, 2014