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Layout-Based Refined NPSF Model for DRAM Characterization and Testing
Sfikas, Yiorgos, Tsiatouhas, Yiorgos E., Hamdioui, SaidVolume:
22
Language:
english
Journal:
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
DOI:
10.1109/TVLSI.2013.2266281
Date:
June, 2014
File:
PDF, 2.19 MB
english, 2014