[ACM Press the 44th annual conference - San Diego, California (2007.06.04-2007.06.08)] Proceedings of the 44th annual conference on Design automation - DAC '07 - Endurance enhancement of flash-memory storage systems
Chang, Yuan-Hao, Hsieh, Jen-Wei, Kuo, Tei-WeiYear:
2007
Language:
english
DOI:
10.1145/1278480.1278533
File:
PDF, 283 KB
english, 2007