Fault Models and Test Methods for Subthreshold SRAMs

IEEE Transactions on Computers 2013 / 03 Vol. 62; Iss. 3

Fault Models and Test Methods for Subthreshold SRAMs

Lin, Chen-Wei, Chen, Hung-Hsin, Yang, Hao-Yu, Huang, Chin-Yuan, Chao, Mango C.-T., Huang, Rei-Fu
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Volume:
62
Language:
english
Journal:
IEEE Transactions on Computers
DOI:
10.1109/TC.2011.252
Date:
March, 2013
File:
PDF, 2.00 MB
english, 2013
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