An advanced single-level polysilicon submicrometer BiCMOS...

IEEE Transactions on Electron Devices 1989 / 4 Vol. 36; Iss. 4

An advanced single-level polysilicon submicrometer BiCMOS technology

Brassington, M.P., El-Diwany, M.H., Razouk, R.R., Thomas, M.E., Tuntasood, P.T.
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Volume:
36
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/16.22476
Date:
April, 1989
File:
PDF, 1.09 MB
english, 1989
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