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[IEEE 2010 IEEE 10th Conference on Nanotechnology (IEEE-NANO) - Ilsan, Gyeonggi-Do, Korea (South) (2010.08.17-2010.08.20)] 10th IEEE International Conference on Nanotechnology - Reversible logic based concurrent error detection methodology for emerging nanocircuits
Thapliyal, Himanshu, Ranganathan, NagarajanYear:
2010
Language:
english
DOI:
10.1109/NANO.2010.5697743
File:
PDF, 165 KB
english, 2010