![](/img/cover-not-exists.png)
[IEEE 2013 11th East-West Design and Test Symposium (EWDTS) - Rostov-on-Don, Russia (2013.09.27-2013.09.30)] East-West Design & Test Symposium (EWDTS 2013) - Coupled TCAD-SPICE simulation of parasitic BJT effect on SOI CMOS SRAM SEU
Petrosyants, K.O., Kharitonov, I.A., Popov, D.A.Year:
2013
Language:
english
DOI:
10.1109/EWDTS.2013.6673141
File:
PDF, 566 KB
english, 2013