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[IEEE 2007 65th Annual Device Research Conference - South Bend, IN, USA (2007.06.18-2007.06.20)] 2007 65th Annual Device Research Conference - Drain-to-Gate Field Engineering for Improved Frequency Response of GaN-based HEMTs
Pala, N., Yang, Z., Koudymov, A., Hu, X., Deng, J., Gaska, R., Simin, G., Shur, M. S.Year:
2007
Language:
english
DOI:
10.1109/DRC.2007.4373643
File:
PDF, 772 KB
english, 2007