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[IEEE 2013 IEEE International Integrated Reliability Workshop (IIRW) - South Lake Tahoe, CA, USA (2013.10.13-2013.10.17)] 2013 IEEE International Integrated Reliability Workshop Final Report - (Late) Essential ingredients for modeling of hot-carrier degradation in ultra-scaled MOSFETs
Tyaginov, Stanislav, Bina, Markus, Franco, Jacopo, Osintsev, Dmitri, Wimmer, Yannick, Kaczer, Ben, Grasser, TiborYear:
2013
Language:
english
DOI:
10.1109/IIRW.2013.6804168
File:
PDF, 483 KB
english, 2013