Physical understanding of hot carrier injection variability...

Japanese Journal of Applied Physics 2014 / 01 Vol. 53; Iss. 4S

Physical understanding of hot carrier injection variability in deeply scaled nMOSFETs

Ma, Lijuan, Ji, Xiaoli, Chen, Zhaoxing, Liao, Yiming, Yan, Feng, Song, Yongliang, Guo, Qiang
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Volume:
53
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.7567/JJAP.53.04EC15
Date:
January, 2014
File:
PDF, 596 KB
english, 2014
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