[IEEE 2007 International Workshop on Physics of Semiconductor Devices - Mumbai, India (2007.12.16-2007.12.20)] 2007 International Workshop on Physics of Semiconductor Devices - Quality assessment of CdZnTe (Zn ∼ 4 %) crystals
Kulkarni, Gururaj A., Koteswara Rao, K. S. R., Raman, R., Pandey, Akhilesh, Sharma, R. K., Garg, A. K., Srivastava, MeenakshiYear:
2007
Language:
english
DOI:
10.1109/IWPSD.2007.4472547
File:
PDF, 192 KB
english, 2007