[IEEE International Test Conference 2004 - Charlotte, NC, USA (26-28 Oct. 2004)] 2004 International Conferce on Test - Scan based side channel attack on dedicated hardware implementations of Data Encryption Standard
Bo Yang,, Kaijie Wu,, Ramesh Karri,Year:
2004
Language:
english
DOI:
10.1109/TEST.2004.1386969
File:
PDF, 456 KB
english, 2004