Stoichiometry control mechanisms for bias-sputtered...

Stoichiometry control mechanisms for bias-sputtered zinc-oxide thin films

Brett, M. J., Parsons, R. R.
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Volume:
63
Language:
english
Journal:
Canadian Journal of Physics
DOI:
10.1139/p85-132
Date:
June, 1985
File:
PDF, 487 KB
english, 1985
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