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[IEEE 2014 19th IEEE European Test Symposium (ETS) - Paderborn, Germany (2014.5.26-2014.5.30)] 2014 19th IEEE European Test Symposium (ETS) - A generic and high-level model of large unreliable NoCs for fault tolerance and performance analysis
Chaix, Fabien, Zergainoh, Nacer-Eddine, Nicolaidis, MichaelYear:
2014
Language:
english
DOI:
10.1109/ETS.2014.6847827
File:
PDF, 433 KB
english, 2014