[IEEE 2009 Proceedings of the European Solid State Device Research Conference (ESSDERC) - Athens, Greece (2009.09.14-2009.09.18)] 2009 Proceedings of the European Solid State Device Research Conference - Revised analysis of Coulomb scattering limited mobility in biaxially strained silicon MOSFETs
Driussi, Francesco, Esseni, DavidYear:
2009
Language:
english
DOI:
10.1109/ESSDERC.2009.5331465
File:
PDF, 996 KB
english, 2009