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[IEEE ICMTS 2005. 2005 International Conference on Microelectronic Test Structures - Leuven, Belgium (4-7 April 2005)] Proceedings of the 2005 International Conference on Microelectronic Test Structures, 2005. ICMTS 2005. - An improved LDMOS transistor model that accurately predicts capacitance for all bias conditions
Frere, S.F., Moens, P., Desoete, B., Wojciechowski D,, Walton, A.J.Year:
2005
Language:
english
DOI:
10.1109/ICMTS.2005.1452226
File:
PDF, 809 KB
english, 2005