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Point defects analysis of zinc oxide thin films annealed at different temperatures with photoluminescence, Hall mobility, and low frequency noise
Ke, Lin, Lai, Szu Cheng, Ye, Jian Dong, Kaixin, Vivian Lin, Chua, Soo JinVolume:
108
Year:
2010
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.3494046
File:
PDF, 761 KB
english, 2010