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[Japan Soc. Promotion of Sci International Vacuum Microelectronics Conference - Osaka, Japan (7-11 July 2003)] IEEE/CPMT/SEMI. 28th International Electronics Manufacturing Technology Symposium (Cat. No.03CH37479) - Improved electron field emission characteristics of MIM cold cathode by thin amorphous carbon film coating

Kim, Y.C., Min-Soo Park,, Nam-Seok Kang,, Kwang-Young Kim,
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Year:
2003
Language:
english
DOI:
10.1109/IVMC.2003.1222985
File:
PDF, 44 KB
english, 2003
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