![](/img/cover-not-exists.png)
[Japan Soc. Promotion of Sci International Vacuum Microelectronics Conference - Osaka, Japan (7-11 July 2003)] IEEE/CPMT/SEMI. 28th International Electronics Manufacturing Technology Symposium (Cat. No.03CH37479) - Improved electron field emission characteristics of MIM cold cathode by thin amorphous carbon film coating
Kim, Y.C., Min-Soo Park,, Nam-Seok Kang,, Kwang-Young Kim,Year:
2003
Language:
english
DOI:
10.1109/IVMC.2003.1222985
File:
PDF, 44 KB
english, 2003