Defect-tolerant interconnect to nanoelectronic circuits:...

Defect-tolerant interconnect to nanoelectronic circuits: internally redundant demultiplexers based on error-correcting codes

Kuekes, Philip J, Robinett, Warren, Seroussi, Gadiel, Williams, R Stanley
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Volume:
16
Language:
english
Journal:
Nanotechnology
DOI:
10.1088/0957-4484/16/6/043
Date:
June, 2005
File:
PDF, 316 KB
english, 2005
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