![](/img/cover-not-exists.png)
Defect-tolerant interconnect to nanoelectronic circuits: internally redundant demultiplexers based on error-correcting codes
Kuekes, Philip J, Robinett, Warren, Seroussi, Gadiel, Williams, R StanleyVolume:
16
Language:
english
Journal:
Nanotechnology
DOI:
10.1088/0957-4484/16/6/043
Date:
June, 2005
File:
PDF, 316 KB
english, 2005