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Application of structured total least squares for system identification and model reduction
Markovsky, I., Willems, J.C., Van Huffel, S., Bart De Moor,, Pintelon, R.Volume:
50
Language:
english
Journal:
IEEE Transactions on Automatic Control
DOI:
10.1109/TAC.2005.856643
Date:
October, 2005
File:
PDF, 574 KB
english, 2005