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[IEEE 2014 International Symposium on Next-Generation Electronics (ISNE) - Kwei-Shan Tao-Yuan, Taiwan (2014.5.7-2014.5.10)] 2014 International Symposium on Next-Generation Electronics (ISNE) - Multi-function controller for low-power multiple scan test of transition delay faults
Liang, Hsing-Chung, Ho, Chang-JungYear:
2014
Language:
english
DOI:
10.1109/ISNE.2014.6839366
File:
PDF, 532 KB
english, 2014