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Discriminative Multimetric Learning for Kinship Verification
Yan, Haibin, Lu, Jiwen, Deng, Weihong, Zhou, XiuzhuangVolume:
9
Language:
english
Journal:
IEEE Transactions on Information Forensics and Security
DOI:
10.1109/TIFS.2014.2327757
Date:
July, 2014
File:
PDF, 3.07 MB
english, 2014