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Annealing effects on the structure and electrical characteristics of amorphous Er 2 O 3 films
Ze-Bo, Fang, Yan-Yan, Zhu, Jia-Le, Wang, Zui-Min, JiangVolume:
18
Language:
english
Journal:
Chinese Physics B
DOI:
10.1088/1674-1056/18/8/067
Date:
August, 2009
File:
PDF, 1.76 MB
english, 2009