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[IEEE 2013 IEEE International Test Conference (ITC) - Anaheim, CA, USA (2013.09.6-2013.09.13)] 2013 IEEE International Test Conference (ITC) - Diagnosis and Layout Aware (DLA) scan chain stitching
Ye, Jing, Huang, Yu, Hu, Yu, Cheng, Wu-Tung, Guo, Ruifeng, Lai, Liyang, Tai, Ting-Pu, Li, Xiaowei, Changchien, Weipin, Lee, Daw-Ming, Chen, Ji-Jan, Eruvathi, Sandeep C., Kumara, Kartik K., Liu, CharleYear:
2013
Language:
english
DOI:
10.1109/TEST.2013.6651929
File:
PDF, 409 KB
english, 2013