[IEEE 2013 International Conference on Multimedia, Signal Processing and Communication Technologies (IMPACT) - Aligarh, India (2013.11.23-2013.11.25)] IMPACT-2013 - Investigation of robust full adder cell in 16-nm CMOS technology node
Dokania, V., Imran, A., Islam, A.Year:
2013
Language:
english
DOI:
10.1109/MSPCT.2013.6782120
File:
PDF, 945 KB
english, 2013