Crosstalk- and Process Variations-Aware High-Quality Tests...

IEEE Transactions on Very Large Scale Integration (VLSI) Systems 2013 / 06 Vol. 21; Iss. 6

Crosstalk- and Process Variations-Aware High-Quality Tests for Small-Delay Defects

Peng, Ke, Yilmaz, Mahmut, Chakrabarty, Krishnendu, Tehranipoor, Mohammad
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Volume:
21
Language:
english
Journal:
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
DOI:
10.1109/TVLSI.2012.2205026
Date:
June, 2013
File:
PDF, 1.24 MB
english, 2013
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