Computing Two-Pattern Test Cubes for Transition Path Delay...

IEEE Transactions on Very Large Scale Integration (VLSI) Systems 2013 / 03 Vol. 21; Iss. 3

Computing Two-Pattern Test Cubes for Transition Path Delay Faults

Pomeranz, Irith
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Volume:
21
Language:
english
Journal:
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
DOI:
10.1109/TVLSI.2012.2188727
Date:
March, 2013
File:
PDF, 2.21 MB
english, 2013
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