Investigation of X-ray induced radiation damage at the Si-SiO 2 interface of silicon sensors for the European XFEL
Zhang, J, Fretwurst, E, Klanner, R, Pintilie, I, Schwandt, J, Turcato, MVolume:
7
Language:
english
Journal:
Journal of Instrumentation
DOI:
10.1088/1748-0221/7/12/C12012
Date:
December, 2012
File:
PDF, 353 KB
english, 2012