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[IEEE Technology of Integrated Systems in Nanoscale Era (DTIS) - Hammamet, Tunisia (2010.03.23-2010.03.25)] 5th International Conference on Design & Technology of Integrated Systems in Nanoscale Era - A concurrent BIST architecture based on Monitoring Square Windows
Voyiatzis, I., Haniotakis, Th., Efstathiou, C., Antonopoulou, H.Year:
2010
Language:
english
DOI:
10.1109/DTIS.2010.5487561
File:
PDF, 4.23 MB
english, 2010