[IEEE Technology of Integrated Systems in Nanoscale Era (DTIS) - Tozeur, Tunisia (2008.03.25-2008.03.27)] 2008 3rd International Conference on Design and Technology of Integrated Systems in Nanoscale Era - On reducing aliasing in accumulator-based compaction
Voyiatzis, I.Year:
2008
Language:
english
DOI:
10.1109/DTIS.2008.4540237
File:
PDF, 555 KB
english, 2008