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Built-In Self-Test of Transmitter I/Q Mismatch and Nonlinearity Using Self-Mixing Envelope Detector
Nassery, Afsaneh, Byregowda, Srinath, Ozev, Sule, Verhelst, Marian, Slamani, MustaphaVolume:
23
Language:
english
Journal:
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
DOI:
10.1109/TVLSI.2014.2308317
Date:
February, 2015
File:
PDF, 5.06 MB
english, 2015