RF Performance of SOI CMOS Technology on Commercial 200-mm...

IEEE Transactions on Electron Devices 2014 / 03 Vol. 61; Iss. 3

RF Performance of SOI CMOS Technology on Commercial 200-mm Enhanced Signal Integrity High Resistivity SOI Substrate

Ali, Khaled Ben, Neve, Cesar Roda, Gharsallah, Ali, Raskin, Jean-Pierre
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Volume:
61
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/TED.2014.2302685
Date:
March, 2014
File:
PDF, 1.69 MB
english, 2014
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