[IEEE 2007 IEEE Conference on Electron Devices and Solid-State Circuits - Tainan, Taiwan (2007.12.20-2007.12.22)] 2007 IEEE Conference on Electron Devices and Solid-State Circuits - Discrete Impurity Dopant Fluctuation in Multi-Fin FinFFTs: 3D Simulation-Based Study
Lin, Jeng-Nan, Chan, Kuo-Chih, Chen, Chin-Yu, Chiang, Meng-HsuehYear:
2007
Language:
english
DOI:
10.1109/EDSSC.2007.4450190
File:
PDF, 1.31 MB
english, 2007