Characterization in silicon processing: Y. Strausser...

International Journal of Mineral Processing 1994 Vol. 42; Iss. 1-2

Characterization in silicon processing: Y. Strausser (Editor). Materials Characterization Series. Surfaces, Interfaces, Thin Films. Butterworth-Heineman, Oxford, 1993, 240 pp., £ 47.50

Madeleine Gandais
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
42
Year:
1994
Language:
english
DOI:
10.1016/0301-7516(94)90025-6
File:
PDF, 50 KB
english, 1994
Conversion to is in progress
Conversion to is failed