Special Issue: Analysis of Covariance || Regression Models...

Special Issue: Analysis of Covariance || Regression Models for Repeated Measurements

Sylvan Wallenstein, F. Yates and Murray Aitkin
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Volume:
38
Language:
english
Journal:
Biometrics
DOI:
10.2307/2530064
Date:
September, 1982
File:
PDF, 728 KB
english, 1982
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