![](/img/cover-not-exists.png)
Investigation of ultra-thin Ag films on Ni with the photoelectron emission microscope
H. Bethge, Th. Krajewski, O. LichtenbergerVolume:
17
Year:
1985
Language:
english
Pages:
10
DOI:
10.1016/0304-3991(85)90173-1
File:
PDF, 1.11 MB
english, 1985