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The use of high resolution electron microscopy and image simulation to determine the sharpness of InP/GaInAs interfaces in multiple quantum-well structures
Amanda K. Petford-Long, G.R. Booker, M. HocklyVolume:
31
Year:
1989
Language:
english
Pages:
13
DOI:
10.1016/0304-3991(89)90337-9
File:
PDF, 5.97 MB
english, 1989