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[Acad. Sci. Res. & Technol First Egyptian Workshop on Advancements of Electronic Devices (EWAED) - Cairo, Egypt (28 Sept. 2002)] The First Egyptian Workshop on Advancements of Electronic Devices, 2002. (EWAED). - Impact of CMOS device scaling in ASICs on radiation immunity
Ragaie, H., Kayed, S.Year:
2002
Language:
english
DOI:
10.1109/EWAED.2002.1177875
File:
PDF, 493 KB
english, 2002