Atomic force microscope detection system using an optical fiber heterodyne interferometer free from external disturbances
Takanori Oshio, Noboru Nakatani, Yoshiyuki Sakai, Norihito Suzuki, Toshihiko KataokaVolume:
42-44
Year:
1992
Language:
english
Pages:
5
DOI:
10.1016/0304-3991(92)90284-q
File:
PDF, 359 KB
english, 1992