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Atomic-scale imaging of anisotropic organic conductors by scanning probe techniques (STM/AFM)
G. Bar, S.N. Magonov, H.-J. Cantow, J. Gmeiner, M. SchwoererVolume:
42-44
Year:
1992
Language:
english
Pages:
9
DOI:
10.1016/0304-3991(92)90336-i
File:
PDF, 1.18 MB
english, 1992