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The effect of sputter deposition conditions on growth mechanism and microstructure of YBa2Cu3O7−x thin films on NdGaO3 substrates studied by scanning tunneling microscopy
M.E. Hawley, I.D. Raistrick, R.J. Houlton, F.H. Garzon, M. PizaVolume:
42-44
Year:
1992
Language:
english
Pages:
10
DOI:
10.1016/0304-3991(92)90346-l
File:
PDF, 1.39 MB
english, 1992