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Correcting for contact geometry in Seebeck coefficient measurements of thin film devices
Reenen, Stephan van, Kemerink, MartijnVolume:
15
Language:
english
Journal:
Organic Electronics
DOI:
10.1016/j.orgel.2014.06.018
Date:
October, 2014
File:
PDF, 488 KB
english, 2014