Surface analysis of organic superconductors by scanning...

Ultramicroscopy 1992 Vol. 42-44; Iss. part-P2

Surface analysis of organic superconductors by scanning probe techniques: STM and AFM

S.N. Magonov, G. Bar, E. Keller, E.B. Yagubskii, E.E. Laukhina, H.-J. Cantow
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Volume:
42-44
Year:
1992
Language:
english
Pages:
10
DOI:
10.1016/0304-3991(92)90394-y
File:
PDF, 4.16 MB
english, 1992
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