Deconvolution method to obtain composition profiles from SEM backscattered electron signal profiles for bulk specimens
A. Konkol, P.R. Wilshaw, G.R. BookerVolume:
55
Year:
1994
Language:
english
Pages:
13
DOI:
10.1016/0304-3991(94)90169-4
File:
PDF, 846 KB
english, 1994