Local quantification of the composition in GaAs/AlxGa1−xAs structures by thickness fringe analysis
Jean-Marc Bonard, Jean-Daniel GanièreVolume:
62
Year:
1996
Language:
english
Pages:
11
DOI:
10.1016/0304-3991(95)00153-0
File:
PDF, 1.48 MB
english, 1996