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Determination of the height of a microstructure sample by a SEM with a conventional and a digital photogrammetric method
M. Schubert, A. Gleichmann, M. Hemmleb, J. Albertz, J.M. KöhlerVolume:
63
Year:
1996
Language:
english
Pages:
8
DOI:
10.1016/0304-3991(96)00028-9
File:
PDF, 682 KB
english, 1996