[IEEE 2010 IEEE 9th International Conference on Development and Learning (ICDL 2010) - Ann Arbor, MI, USA (2010.08.18-2010.08.21)] 2010 IEEE 9th International Conference on Development and Learning - Autism as an impairment in detecting invariants
Mayer, Norbert Michael, Fasel, IanYear:
2010
Language:
english
DOI:
10.1109/DEVLRN.2010.5578833
File:
PDF, 817 KB
english, 2010