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[IEEE 2010 IEEE 9th International Conference on Development and Learning (ICDL 2010) - Ann Arbor, MI, USA (2010.08.18-2010.08.21)] 2010 IEEE 9th International Conference on Development and Learning - Autism as an impairment in detecting invariants

Mayer, Norbert Michael, Fasel, Ian
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Year:
2010
Language:
english
DOI:
10.1109/DEVLRN.2010.5578833
File:
PDF, 817 KB
english, 2010
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